[Int. Test Conference International Test Conference 1998 - Washington, DC, USA (18-23 Oct. 1998)] Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270) - Built-in self-test of FPGA interconnect
Stroud, C., Wijesuriya, S., Hamilton, C., Abramovici, M.Рік:
1998
Мова:
english
Сторінки:
8
DOI:
10.1109/test.1998.743180
Файл:
PDF, 767 KB
english, 1998