Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis
Ludwig, W., Reischig, P., King, A., Herbig, M., Lauridsen, E. M., Johnson, G., Marrow, T. J., Buffiere, J. Y.Том:
80
Рік:
2009
Мова:
english
DOI:
10.1063/1.3100200
Файл:
PDF, 962 KB
english, 2009