[IEEE ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures - Kobe, Japan (19-22 March 2001)] ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) - Statistical SPICE analysis of a 0.18 μm CMOS digital/analog technology during process development
Rankin, N.S., Chun Ng,, Leang Sern Ee,, Boyland, F., Quek, E., Leung Ying Keung,, Walton, A.J., Redford, M.Рік:
2001
Мова:
english
Сторінки:
5
DOI:
10.1109/icmts.2001.928631
Файл:
PDF, 488 KB
english, 2001
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