High resolution electron microscopy investigations of interface and other structure defects in some ceramics
Wen, Shulin, Liu, QianТом:
40
Мова:
english
Сторінки:
10
Журнал:
Microscopy Research and Technique
DOI:
10.1002/(sici)1097-0029(19980201)40:33.0.co;2-s
Date:
February, 1998
Файл:
PDF, 519 KB
english, 1998