CHARACTERIZATION OF FOREIGN ATOMS AND NATIVE DEFECTS IN SINGLE CRYSTALS OF CADMIUM TELLURIDE BY HIGH‐TEMPERATURE CONDUCTIVITY MEASUREMENTS
Zanio, K. R.Том:
15
Рік:
1969
Мова:
english
DOI:
10.1063/1.1652992
Файл:
PDF, 505 KB
english, 1969