SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Design and Testing V - Analysis on the effect of extinction ratio in birefringent measurement by phase-stepping method
Zhang, Xusheng, Wang, Haoyu, He, Chuan, Wang, Yongtian, Du, Chunlei, Hua, Hong, Tatsuno, Kimio, Urbach, H. PaulТом:
8557
Рік:
2012
Мова:
english
DOI:
10.1117/12.999274
Файл:
PDF, 274 KB
english, 2012