Low-Energy X-ray and Ozone-Exposure Induced Defect Formation in Graphene Materials and Devices
Zhang, En Xia, Newaz, A. K. M., Wang, Bin, Bhandaru, Shweta, Zhang, C. Xuan, Fleetwood, Daniel M., Bolotin, Kirill I., Pantelides, Sokrates T., Alles, Michael L., Schrimpf, Ronald D., Weiss, Sharon M.Том:
58
Мова:
english
Журнал:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2167519
Date:
December, 2011
Файл:
PDF, 444 KB
english, 2011