Direct characterization of ultraviolet-light-induced refractive index structures by scanning near-field optical microscopy
Svalgaard, M., Madsen, S., Hvam, J.M., Kristensen, M.Том:
10
Рік:
1998
Мова:
english
DOI:
10.1109/68.681506
Файл:
PDF, 65 KB
english, 1998