Point Defect Clusters and Dislocations in FIB Irradiated Nanocrystalline Aluminum Films: An Electron Tomography and Aberration-Corrected High-Resolution ADF-STEM Study
Idrissi, Hosni, Turner, Stuart, Mitsuhara, Masatoshi, Wang, Binjie, Hata, Satoshi, Coulombier, Michael, Raskin, Jean-Pierre, Pardoen, Thomas, Van Tendeloo, Gustaaf, Schryvers, DominiqueТом:
17
Мова:
english
Журнал:
Microscopy and Microanalysis
DOI:
10.1017/S143192761101213X
Date:
December, 2011
Файл:
PDF, 375 KB
english, 2011
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