SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Terahertz and High Energy Radiation Detection Technologies and Applications - Industrial applications of THz systems
Wietzke, S., Jansen, C., Jördens, C., Krumbholz, N., Vieweg, N., Scheller, M., Shakfa, M. K., Romeike, D., Hochrein, T., Mikulics, M., Koch, M., Zhang, X.-C., Ryan, James M., Zhang, Cun-lin, Tang, ChuТом:
7385
Рік:
2009
Мова:
english
DOI:
10.1117/12.840991
Файл:
PDF, 1.16 MB
english, 2009
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