Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple-Cell Upsets in 10T Subthreshold SRAM
Fuketa, Hiroshi, Harada, Ryo, Hashimoto, Masanori, Onoye, TakaoТом:
14
Мова:
english
Журнал:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2013.2252430
Date:
March, 2014
Файл:
PDF, 366 KB
english, 2014
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