[IEEE IEEE International Symposium on Electromagnetic Compatibility - Washington, DC, USA (21-23 Aug. 1990)] IEEE International Symposium on Electromagnetic Compatibility - A methodology for the evaluation of HPM effects on electronic systems
Pesta, A.J., Capraro, G.T.Рік:
1990
Мова:
english
DOI:
10.1109/ISEMC.1990.252787
Файл:
PDF, 409 KB
english, 1990