[IEEE 2009 IEEE International Conference on Control Applications (CCA) - St. Petersburg, Russia (2009.07.8-2009.07.10)] 2009 IEEE International Conference on Control Applications - A comparison of ANFIS, MLP and SVM in identification of chemical processes
Efe, Mehmet OnderРік:
2009
Мова:
english
DOI:
10.1109/CCA.2009.5281184
Файл:
PDF, 406 KB
english, 2009