SPIE Proceedings [SPIE SPIE's First International Symposium on Fluctuations and Noise - Santa Fe, NM (Sunday 1 June 2003)] Noise in Devices and Circuits - Generation-recombination noise in GaN and GaN-based devices
Pala, Nezih, Rumyantsev, Sergey L., Shur, Michael S., Levinshtein, Michael E., Khan, M. Asif, Simin, Grigory S., Gaska, Remis, Deen, M. Jamal, Celik-Butler, Zeynep, Levinshtein, Michael E.Том:
5113
Рік:
2003
Мова:
english
DOI:
10.1117/12.488468
Файл:
PDF, 269 KB
english, 2003