SPIE Proceedings [SPIE Optical Sensing for Environmental and Process Monitoring - McLean, VA (Sunday 6 November 1994)] Optical Instrumentation for Gas Emissions Monitoring and Atmospheric Measurements - Chemical vapor detection and mapping with a multispectral forward-looking infrared (FLIR)
Althouse, Mark L., Chang, Chein-I, Leonelli, Joseph, Killinger, Dennis K., Vaughan, William, Yost, Michael G.Том:
2366
Рік:
1995
Мова:
english
DOI:
10.1117/12.205550
Файл:
PDF, 443 KB
english, 1995
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