IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2013 / 10 Vol. 32; Iss. 10
Stochastic Testing Method for Transistor-Level Uncertainty Quantification Based on Generalized Polynomial Chaos
Zhang, Zheng, El-Moselhy, Tarek A., Elfadel, Ibrahim M., Daniel, LucaТом:
32
Мова:
english
Журнал:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2013.2263039
Date:
October, 2013
Файл:
PDF, 12.68 MB
english, 2013
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