SPIE Proceedings [SPIE LASE - San Francisco, California (Saturday 23 January 2010)] High-Power Diode Laser Technology and Applications VIII - Reliability of high performance 9xx-nm single emitter laser diodes
Bao, Ling, Wang, Jun, Devito, Mark, Xu, Dapeng, Wise, Damian, Leisher, Paul, Grimshaw, Mike, Dong, Weimin, Zhang, Shiguo, Price, Kirk, Li, Daming, Bai, Chendong, Patterson, Steve, Martinsen, Rob, ZediТом:
7583
Рік:
2010
Мова:
english
DOI:
10.1117/12.842856
Файл:
PDF, 1.37 MB
english, 2010
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