Effect of low constant current stress treatment on the performance of the Cu/ZrO 2 /Pt resistive switching device
Xie, Hongwei, Liu, Qi, Li, Yingtao, Lv, Hangbing, Wang, Ming, Zhang, Kangwei, Long, Shibing, Liu, Su, Liu, MingТом:
27
Мова:
english
Журнал:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/27/10/105007
Date:
October, 2012
Файл:
PDF, 469 KB
english, 2012
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