Electron tunneling spectroscopy study of electrically active traps in AlGaN/GaN high electron mobility transistors
Yang, Jie, Cui, Sharon, Ma, T. P., Hung, Ting-Hsiang, Nath, Digbijoy, Krishnamoorthy, Sriram, Rajan, SiddharthТом:
103
Рік:
2013
Мова:
english
Журнал:
Applied Physics Letters
DOI:
10.1063/1.4834698
Файл:
PDF, 1.21 MB
english, 2013