Evaluating the Effects of Single Event Transients in FET-Based Single-Pole Double-Throw RF Switches
Cardoso, Adilson S., Chakraborty, Partha S., Lourenco, Nelson E., England, Troy D., Saha, Prabir, Howard, Duane C., Fleischhauer, David M., Warner, Jeffrey H., McMorrow, Dale, Buchner, Stephen P., PakТом:
61
Мова:
english
Журнал:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2014.2301448
Date:
April, 2014
Файл:
PDF, 1.89 MB
english, 2014