Experimental investigation of Zener diode reliability under pulsed Electrical Overstress (EOS)
Zhu, F., Fouquet, F., Ravelo, B., Alaeddine, A., Kadi, M.Том:
53
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.077
Date:
September, 2013
Файл:
PDF, 2.02 MB
english, 2013