Reliability assessment of CMOS differential cross-coupled LC oscillators and a novel on chip self-healing approach against aging phenomena
Afacan, Engin, Dundar, Gunhan, Baskaya, FaikТом:
54
Мова:
english
Журнал:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.08.013
Date:
February, 2014
Файл:
PDF, 832 KB
english, 2014
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