Characterization of deep levels in GaInP on Ge and Ge-on-Si substrates by photoluminescence and cathodoluminescence
Yang, Changjae, Lee, Sangsoo, Shin, Keun-Wook, Oh, Sewoung, Moon, Daeyoung, Kim, Sung-Dae, Kim, Young-Woon, Kim, Chang-Zoo, Park, Won-kyu, Choi, Won Jun, Park, Jinsub, Yoon, EuijoonТом:
370
Мова:
english
Журнал:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2012.09.012
Date:
May, 2013
Файл:
PDF, 1.41 MB
english, 2013
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