[IEEE 2009 International Conference on Biometrics and Kansei Engineering, ICBAKE - Cieszyn, Poland (2009.06.25-2009.06.28)] 2009 International Conference on Biometrics and Kansei Engineering - Applicability of F-value to Classification Problems with a Numerous Number of Explanatory Variables: Toward Classification Problems in Biometric and Kansei Engineering
Nagashima, Tomomasa, Wang, Xinping, Okada, Yoshifumi, Sawai, MasahiroРік:
2009
Мова:
english
DOI:
10.1109/ICBAKE.2009.45
Файл:
PDF, 499 KB
english, 2009
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