[IEEE 2006 International Electron Devices Meeting - San Francisco, CA, USA (2006.12.11-2006.12.13)] 2006 International Electron Devices Meeting - Reliability Model of Bandgap Engineered SONOS (BE-SONOS)
Lue, Hang-Ting, Wang, Szu-Yu, Hsiao, Yi-Hsuan, Lai, Erh-Kun, Yang, Ling-Wu, Yang, Tahone, Chen, Kuang-Chao, Hsieh, Kuang-Yeu, Liu, Rich, Lu, Chih YuanРік:
2006
Мова:
english
DOI:
10.1109/IEDM.2006.346822
Файл:
PDF, 297 KB
english, 2006