[IEEE 2013 IEEE Custom Integrated Circuits Conference - CICC 2013 - San Jose, CA, USA (2013.09.22-2013.09.25)] Proceedings of the IEEE 2013 Custom Integrated Circuits Conference - Testability improvement for 12.8 GB/s Wide IO DRAM controller by small area pre-bonding TSV tests and a 1 GHz sampled fully digital noise monitor
Nomura, Takao, Mori, Ryo, Ito, Munehiro, Takayanagi, Koji, Ochiai, Toshihiko, Fukuoka, Kazuki, Otsuga, Kazuo, Nii, Koji, Morita, Sadayuki, Hashimoto, Tomoaki, Kida, Tsuyoshi, Yamada, Junichi, Tanaka,Рік:
2013
Мова:
english
DOI:
10.1109/cicc.2013.6658415
Файл:
PDF, 1.37 MB
english, 2013
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