Band structure of carbonated amorphous silicon studied by optical, photoelectron, and x-ray spectroscopy
Solomon, I., Schmidt, M. P., Sénémaud, C., Driss Khodja, M.Том:
38
Мова:
english
Журнал:
Physical Review B
DOI:
10.1103/PhysRevB.38.13263
Date:
December, 1988
Файл:
PDF, 386 KB
english, 1988