[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Systematic methods to identify and verify non-visible defects in silicon substrate
Huang, Hongwei, Wei, Winnie, Xin, J. J., Liu, Candy, Wu, Luke, Dai, Clieve, Liao, Pinglung, Xu, WeiРік:
2014
Мова:
english
DOI:
10.1109/IPFA.2014.6898133
Файл:
PDF, 1.52 MB
english, 2014
File converter
Більше результатів пошуку
More benefits 
