Fast power cycling test for insulated gate bipolar transistor modules in traction application
Held, M., Jacob, P., Nicoletti, G., Scacco And, P., Poech, M.-H.Том:
86
Мова:
english
Журнал:
International Journal of Electronics
DOI:
10.1080/002072199132743
Date:
October, 1999
Файл:
PDF, 632 KB
english, 1999