[IEEE 2011 IEEE-IAS/PCA Cement Industry Conference - St. Louis, MO, USA (2011.05.22-2011.05.26)] 2011 IEEE-IAS/PCA 53rd Cement Industry Technical Conference - A new method for analyzing particle attrition dynamics using three-dimensional profiling
Buchanan, Gregory, Buchanan, Charles E.Рік:
2011
Мова:
english
DOI:
10.1109/CITCON.2011.5934561
Файл:
PDF, 2.50 MB
english, 2011