[IEEE 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Melbourne VIC, Australia (2014.6.1-2014.6.5)] 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - A compact on-chip IR-drop measurement system in 28 nm CMOS technology
Dietel, Sebastian, Hoppner, Sebastian, Eisenreich, Holger, Ellguth, Georg, Hanzsche, Stefan, Henker, Stephan, Schuffny, Rene, Brauninger, Tim, Fiedler, UlrichРік:
2014
Мова:
english
DOI:
10.1109/ISCAS.2014.6865361
Файл:
PDF, 1.36 MB
english, 2014
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