[IEEE 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2008.11.10-2008.11.13)] 2008 IEEE/ACM International Conference on Computer-Aided Design - Effective IR-drop reduction in at-speed scan testing using distribution-controlling X-Identification
Miyase, Kohei, Kenji Noda,, Hideaki Ito,, Kazumi Hatayama,, Takashi Aikyo,, Yuta Yamato,, Hiroshi Furukawa,, Xiaoqing Wen,, Seiji Kajihara,Рік:
2008
Мова:
english
DOI:
10.1109/ICCAD.2008.4681551
Файл:
PDF, 844 KB
english, 2008
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