[IEEE 2008 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Conference on Computer Vision and Pattern Recognition - Using contours to detect and localize junctions in natural images
Maire, Michael, Arbelaez, Pablo, Fowlkes, Charless, Malik, JitendraРік:
2008
Мова:
english
DOI:
10.1109/cvpr.2008.4587420
Файл:
PDF, 1.82 MB
english, 2008