[IEEE 2012 Annual Reliability and Maintainability Symposium (RAMS) - Reno, NV, USA (2012.01.23-2012.01.26)] 2012 Proceedings Annual Reliability and Maintainability Symposium - Integrated importance analysis with Markov Bayesian networks
Si, Shubin, Du, Li, Cai, Zhiqiang, Dui, HongyanРік:
2012
Мова:
english
DOI:
10.1109/rams.2012.6175438
Файл:
PDF, 454 KB
english, 2012