Experimental Assessment of Electrons and Holes in Erase Transient of TANOS and TANVaS Memories
Suhane, Amit, Arreghini, Antonio, Van den bosch, Geert, Vandelli, Luca, Padovani, Andrea, Breuil, Laurent, Larcher, Luca, De Meyer, Kristin, Van Houdt, JanТом:
31
Мова:
english
Журнал:
IEEE Electron Device Letters
DOI:
10.1109/led.2010.2055824
Date:
September, 2010
Файл:
PDF, 434 KB
english, 2010