[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Systematic design technique for improvements of mobile phone's immunity to electrostatic discharge soft failures
Ki Hyuk Kim,, Jeong-Hoi Koo,, Bong-Gyu Kang,, Soon Jae Kwon,, Yongsup Kim,, Joongho Jeong,Рік:
2010
Мова:
english
DOI:
10.1109/isemc.2010.5711299
Файл:
PDF, 736 KB
english, 2010
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