[IEEE IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (7-11 July 2003)] Proceedings of the 10th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2003 - MEMS failure analysis and reliability
Samper, V., Trigg, A.Рік:
2003
Мова:
english
DOI:
10.1109/ipfa.2003.1222713
Файл:
PDF, 660 KB
english, 2003