[IEEE 2010 15th Asia and South Pacific Design Automation Conference ASP-DAC 2010 - Taipei, Taiwan (2010.01.18-2010.01.21)] 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC) - Secure and testable scan design using extended de Bruijn graphs
Fujiwara, Hideo, Obien, Marie Engelene J.Рік:
2010
Мова:
english
DOI:
10.1109/aspdac.2010.5419845
Файл:
PDF, 609 KB
english, 2010