Towards 3D charge localization by a method derived from atomic force microscopy: the electrostatic force distance curve
Villeneuve-Faure, C, Boudou, L, Makasheva, K, Teyssedre, GТом:
47
Мова:
english
Журнал:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/47/45/455302
Date:
November, 2014
Файл:
PDF, 907 KB
english, 2014