[IEEE 6th International Conference on Solid-State and IC Technology - Shanghai, China (22-25 Oct. 2001)] 2001 6th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.01EX443) - Observation of deep electron states in n-type Al-doped ZnS/sub 1-x/Te/sub x/ grown by molecular beam epitaxy
Liwu Lu,, Weikun Ge,, Sou, I.K., Wang, J.Том:
2
Рік:
2001
Мова:
english
DOI:
10.1109/icsict.2001.982175
Файл:
PDF, 156 KB
english, 2001
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