[IEEE 2010 International Conference on Microelectronic Test Structures (ICMTS) - Hiroshima, Japan (2010.03.22-2010.03.25)] 2010 International Conference on Microelectronic Test Structures (ICMTS) - Small embedded sensors for accurate temperature measurements in DMOS power transistors
Pfost, Martin, Costachescu, Dragos, Podgaynaya, Alja, Stecher, Matthias, Bychikhin, Sergey, Pogany, Dionyz, Gornik, ErichРік:
2010
Мова:
english
DOI:
10.1109/icmts.2010.5466872
Файл:
PDF, 283 KB
english, 2010
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