[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A study of the failure of GaN-based LEDs submitted to reverse-bias stress and ESD events
Meneghini, Matteo, Tazzoli, Augusto, Ranzato, Enrico, Trivellin, Nicola, Meneghesso, Gaudenzio, Zanoni, Enrico, Pavesi, Maura, Manfredi, Manfredo, Butendeich, Rainer, Zehnder, Ulrich, Hahn, BertholdРік:
2010
Мова:
english
DOI:
10.1109/irps.2010.5488776
Файл:
PDF, 369 KB
english, 2010
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