[IEEE 2004 International Semiconductor Conference. CAS 2004 - Sinaia, Romania (4-6 Oct. 2004)] 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) - Screening the reliable semiconductor chips by laser acceleration of deep level recombination. Process certification for industrial application
Galateanu, L., Bazu, M., Ilian, V., Tibeica, C., Petu, A., Apostol, D., Damian, V.Том:
2
Рік:
2004
Мова:
english
DOI:
10.1109/smicnd.2004.1402999
Файл:
PDF, 350 KB
english, 2004
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