[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction application
Jacob, P., Held, M., Scacco, P.Рік:
1995
Мова:
english
DOI:
10.1109/ipfa.1995.487618
Файл:
PDF, 732 KB
english, 1995