DESIGN AND PERFORMANCE OF TWO ORTHOGONAL EXTRACTION TIME-OF-FLIGHT SECONDARY ION MASS SPECTROMETERS FOR FOCUSED ION BEAM INSTRUMENTS
Alberts, Deborah, von Werra, Leandro, Oestlund, Fredrik, Rohner, Urs, Hohl, Markus, Michler, Johann, Whitby, James A.Том:
42
Мова:
english
Журнал:
Instrumentation Science & Technology
DOI:
10.1080/10739149.2013.878843
Date:
July, 2014
Файл:
PDF, 1.35 MB
english, 2014
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