Design Framework for Soft-Error-Resilient Sequential Cells
Lee, Hsiao-Heng Kelin, Lilja, Klas, Bounasser, Mounaim, Linscott, Ivan, Inan, UmranТом:
58
Мова:
english
Журнал:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2011.2168611
Date:
December, 2011
Файл:
PDF, 827 KB
english, 2011