[IEEE 2009 10th Latin American Test Workshop - Rio de Janeiro, Brazil (2009.03.2-2009.03.5)] 2009 10th Latin American Test Workshop - Using Bulk Built-In Current Sensors and recomputing techniques to mitigate transient faults in microprocessors
Leite, Franco, Balen, Tiago, Herve, Marcos, Lubaszewski, Marcelo, Wirth, GilsonРік:
2009
Мова:
english
DOI:
10.1109/latw.2009.4813790
Файл:
PDF, 186 KB
english, 2009