[IEEE 2013 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with NSREC 2013) - San Francisco, CA, USA (2013.07.8-2013.07.12)] 2013 IEEE Radiation Effects Data Workshop (REDW) - Characterization and Analyses of RadHard-by-Design CMOS Quad Operational Amplifiers
Benson, Ray, Resch, Paul, Milanowski, RandallРік:
2013
Мова:
english
DOI:
10.1109/redw.2013.6658185
Файл:
PDF, 908 KB
english, 2013