[IEEE 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - San Francisco, CA, USA (2010.06.13-2010.06.18)] 2010 IEEE Computer Society Conference on Computer Vision and Pattern Recognition - Workshops - A mutual-information scale-space for image feature detection and feature-based classification of volumetric brain images
Toews, Matthew, Wells, William M.Рік:
2010
Мова:
english
DOI:
10.1109/cvprw.2010.5543471
Файл:
PDF, 416 KB
english, 2010