[IEEE 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Hyderabad, India (2006.01.3-2006.01.7)] 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - An area efficient mixed-signal test architecture for systems-on-a-chip
Venkatanarayanan, H.V., Bushnell, M.L.Рік:
2006
Мова:
english
DOI:
10.1109/vlsid.2006.39
Файл:
PDF, 178 KB
english, 2006
File converter
Більше результатів пошуку
More benefits 
